Ultrasonic probe for examining an object with ultrasound and corresponding examination method
US9541529B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 8, 2014 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Jul 16, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ultrasonic probe for examining an object with ultrasound and a corresponding examination method are provided. The probe includes a plurality of emitter elements able to emit ultrasonic waves for emitting a focused ultrasonic beam into the object through an active area of a surface of the object, and a profilometer for determining the profile of the surface of the object and for controlling the emission of the ultrasonic beam depending on the determined profile. The profilometer includes an image-taking apparatus for taking at least one digital image of the active area and an image processing module able to determine the profile of the active area by analyzing the optical blurring of the or at least one image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.