Computer node testing
US9542289B2 · kind B2 · utility
0Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 30, 2015 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Mar 5, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/41
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A computer node comprises dual hard drives. A method of testing the computer node comprises performing a test of the first hard drive, waiting a specific time period, and performing a test of the second hard drive. Each test comprises isolating the drive being tested, writing data to the drive being tested, removing power from the drive being tested, repowering the drive being tested, and reading data from the drive being tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.