Overlapped fast fourier transform based measurements using flat-in-time windowing
US9542358B1 · kind B1 · utility
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20Claims
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Key dates
| Filing date | Aug 16, 2013 |
| Grant date | Jan 10, 2017 |
| Priority date | — |
| Expiry date | Oct 15, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F17/142
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An electromagnetic interference (EMI) signal is processed by digitizing the EMI signal, generating a plurality of overlapping time records from the digitized EMI signal, applying a window function to the plurality of overlapping time records to produce a plurality of modified time records, wherein the window function has a substantially flat top, and performing a fast Fourier transform (FFT) on each of the modified time records to produce a plurality of corresponding amplitude envelopes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.