Test control point insertion and X-bounding for logic built-in self-test (LBIST) using observation circuitry
US9547043B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 7, 2013 |
| Grant date | Jan 17, 2017 |
| Priority date | — |
| Expiry date | Nov 30, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3187
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Test control point insertion and x-bounding for Logic Built-In Self-Test (LBIST) using observation circuitry. In some embodiments, LBIST circuitry may include a plurality of test control circuits coupled to a scan chain of a Circuit Under Test (CUT), and a plurality of observation circuits coupled to the test control circuits, each of the plurality of observation circuits including one or more latch devices configured to drive a respective one of the plurality of test control circuits. In other embodiments, a method of testing an integrated circuit may include issuing an instruction that a plurality of observation circuits and a plurality of input/output (I/O) control circuits within the integrated circuit enter a test mode, and providing, one or more test patterns to a selected one or more of a plurality of scan chains within the integrated circuit and to each of the plurality of observation circuits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.