Injected touch noise analysis
US9547399B2 · kind B2 · utility
0Cited by
9References
20Claims
0Family size
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Key dates
| Filing date | Oct 27, 2014 |
| Grant date | Jan 17, 2017 |
| Priority date | — |
| Expiry date | Jan 10, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K2217/960705
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A processing device configured to induce, during a listening scan of a sense array, an injected touch to produce similar data as would be present during a touch scan of the sense array with a conductive object at a known location on the sense array. The processing device is further configured to compute, using the data, an estimate of a noise metric based on the injected touch.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.