Patent · US Active

Automatic profiling report generation

US9547537B2 · kind B2 · utility

4Cited by

1References

20Claims

0Family size

Assignee

SAP SE · DE

Inventors

Johannes Scheerer · Heidelberg, DE
Ralf Schmelter · Wiesloch, DE
Steffen Schreiber · Bischofswerda, DE
Dietrich Mostowoj · Ludwigshafen, DE
Thomas Klink · Bad Kissingen, DE
Matthias Braun · Ludwigsburg, DE

Key dates

Filing date	Oct 30, 2014
Grant date	Jan 17, 2017
Priority date	—
Expiry date	Mar 25, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG06F2201/815
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method for profiling an application on a virtual machine is provided. A series of analysis steps to be performed on profiled data can be created. The series of analysis steps can be saved as a report specification. A back-end profiler can then be caused to perform profiling on the application. Profiled data can be received from the back-end profiler. The profiled data can be stored as a model. The model can then be adapted based on the series of analysis steps from the report specification. Output data can be generated based on the adapted model. Finally, the output data is displayed to a user.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.