Analog-to-digital converter with redundancy for image sensor readout
US9548755B2 · kind B2 · utility
2Cited by
1References
17Claims
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Key dates
| Filing date | Jul 3, 2014 |
| Grant date | Jan 17, 2017 |
| Priority date | — |
| Expiry date | Jul 29, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/56
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Methods and systems for analog-to-digital conversion applicable to an image sensor, such as a CMOS image sensor, in which an ADC comprises built-in redundancy such that the ADC can start its conversion cycle before the ADC input settles to a desired resolution and the ADC can yet accurately convert the ADC input to a digital value with the desired resolution. In a CMOS image sensor, such an ADC configuration enables the pixel readout time to overlap with the ADC conversion time, reducing the total time needed to convert the pixel signal value to a digital value with the desired resolution.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.