Method and device for detecting, in particular, refracting defects
US9551671B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2013 |
| Grant date | Jan 24, 2017 |
| Priority date | — |
| Expiry date | Jan 15, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/062
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An in-line method for optically inspecting transparent or translucent containers (3) comprises illuminating each container with a light source that presents light intensity variation in a periodic pattern along at least a first variation direction. A number N greater than or equal to three of images of the container traveling in front of the light source and occupying N different respective positions along the travel path is taken. Between taking successive images, a relative shift between the container and the periodic pattern is created. A geometrical transformation is determined and applied in order to put the pixels belonging to the container in the N successive images of the same container into coincidence. A phase image for each container is constructed using the N registered images of the container. The phase image is analyzed in order to deduce therefrom at least the presence of defects or the quality of the container.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.