Detecting early failures in printed wiring boards
US9551744B2 · kind B2 · utility
0Cited by
17References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 3, 2013 |
| Grant date | Jan 24, 2017 |
| Priority date | — |
| Expiry date | Sep 11, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2801
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.