Patent · US Active

On-chip vertical three dimensional microstrip line with characteristic impedance tuning technique and design structures

US9553348B2 · kind B2 · utility

1Cited by
35References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 13, 2016
Grant dateJan 24, 2017
Priority date
Expiry dateApr 13, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A vertical three dimensional (3D) microstrip line structure for improved tunable characteristic impedance, methods of manufacturing the same and design structures are provided. More specifically, a method is provided that includes forming a first microstrip line structure within a back end of the line (BEOL) stack. The method further includes forming a second microstrip line structure separated from the BEOL stack by a predetermined horizontal distance.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.