System and method for calibration of an optical module
US9553663B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 21, 2015 |
| Grant date | Jan 24, 2017 |
| Priority date | — |
| Expiry date | Sep 21, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/40
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A system and method for calibrating an optical module. The optical module including a microprocessor with non-volatile memory is provided at a calibration station for measuring calibrated value of a device parameter against raw values starting from minimum value in each of multiple zones of a primary parameter with one or more secondary parameters at least being set to a basis calibration point to determine coefficients for generating a N-spline function for the multiple zones and multiple multipliers for each zone corresponding to multiple calibration points. The coefficients and multiple multipliers are stored in the non-volatile memory and reused respectively for calculating a basis calibrated value based on any current raw value of the primary parameter a N-spline function in particular zone and for determining a final multiplier by interpolation of the multiple multipliers associated with the one or more secondary parameters, leading to a calibrated value for any condition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.