Patent · US Active

Dimensioning system with multipath interference mitigation

US9557166B2 · kind B2 · utility

52Cited by
315References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 21, 2014
Grant dateJan 31, 2017
Priority date
Expiry dateOct 21, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/255
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method for measuring an item's dimensions using a time-of-flight dimensioning system is disclosed. The system and method mitigate multipath distortion and improve the accuracy of the measurements, especially in a mobile environment. To mitigate the multipath distortion, an imager captures an image of an item of interest. This image is processed to determine an illumination region corresponding item-of-interest's size, shape, and position. Using this information, an adjustable aperture's size, shape, and position are controlled so the light beam used in the time-of-flight analysis substantially illuminates the illumination region without first being reflected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.