Patent · US Active

Universal multidetection system for microplates

US9557217B2 · kind B2 · utility

3Cited by

38References

18Claims

0Family size

Assignee

BTI Inc. · US

Inventors

Oleg Zimenkov · South Burlington, US
Xavier Amouretti · South Burlington, US
Michael Kontorovich · Colchester, US
Ben Norris · Vergennes, US
Richard N. Sears · Jericho, US
Dan Venditti · Colchester, US
Christopher Many · Swanton, US
Bill Anderson · Colchester, US
Ben Knight · Shelburne, US
James Piette · Winooski, US
Ross Piette · South Burlington, US
Joe Tobey · Saint Johnsbury Center, US
Brian Ferris · Saint Albans, US

Key dates

Filing date	May 31, 2012
Grant date	Jan 31, 2017
Priority date	—
Expiry date	Apr 29, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/6463
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An apparatus for optically analyzing a sample may include an imaging subsystem that images the sample, one or more analyzing subsystems that analyze the sample, a temperature control subsystem that controls a temperature of the atmosphere within the apparatus, a gas control subsystem that controls a composition of the atmosphere within the apparatus, and a control module that controls the various subsystems of the apparatus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.