Minimal reconfiguration spectrum stitching with overlapped bands
US9557358B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 20, 2011 |
| Grant date | Jan 31, 2017 |
| Priority date | — |
| Expiry date | Feb 13, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of this invention include a test and measurement instrument and associated methods for acquiring and stitching wide overlapped non-uniform frequency bands so that a user specified band can be efficiently displayed and analyzed. The test and measurement instrument includes a user interface to receive the user specified frequency span. Acquisition circuitry acquires one or more predefined frequency bands having non-uniform overlapping frequency ranges. A frequency band processing section can decimate the acquired frequency bands, mask the acquired frequency bands, and stitch the masked frequency bands together. A display section displays the user specified frequency span using the stitched frequency bands. Due to the overlap configuration of the wide non-uniform bands, any user specified span between 50 kHz and 6 GHz, or thereabout, can be covered by two bands.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.