Patent · US Active

X-ray radiation detector and method for measuring X-ray radiation

US9557426B2 · kind B2 · utility

0Cited by

4References

20Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Daniel Niederloehner · Erlangen, DE
Christian Schroeter · Bamberg, DE

Key dates

Filing date	Jan 21, 2013
Grant date	Jan 31, 2017
Priority date	—
Expiry date	Apr 13, 2033

Classification

Technology area (CPC H)Electricity
CPC primaryH10F39/189
WIPO fieldEnvironmental technology
WIPO sectorChemistry

Abstract

An x-ray radiation detector is disclosed with an upper side, which faces an x-ray radiation source during operation, and with a semiconductor layer for direct conversion of x-ray radiation into electric measurement signals. In an embodiment, a luminous film is arranged between the upper side and the semiconductor layer, and with the aid of which luminous film, electromagnetic radiation can be coupled into the semiconductor layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.