Data quality assessment
US9558230B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2013 |
| Grant date | Jan 31, 2017 |
| Priority date | — |
| Expiry date | Jan 25, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/215
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
According to one embodiment of the present invention, a system assesses the quality of column data. The system assigns a pre-defined domain to one or more columns of the data based on a validity condition for the domain, applies the validity condition for the domain assigned to a column to data values in the column to compute a data quality metric for the column, and computes and displays a metric for a group of columns based on the computed data quality metric of at least one column in the group. Embodiments of the present invention further include a method and computer program product for assessing the quality of column data in substantially the same manners described above.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.