Integrated test coverage measurement in distributed systems
US9559928B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 2013 |
| Grant date | Jan 31, 2017 |
| Priority date | — |
| Expiry date | Feb 21, 2034 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/55
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
Methods and systems for implementing test coverage measurement are disclosed. A first set of interactions among a set of production services are determined. The first set of interactions comprises a plurality of service requests between individual ones of the set of production services. A second set of interactions among a set of test services are determined. The second set of interactions comprises a plurality of service requests between individual ones of the set of test services. A test coverage metric is generated. The test coverage metric indicates an amount of the first set of interactions that are covered by the second set of interactions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.