Specular object scanner for measuring reflectance properties of objects
US9562857B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2014 |
| Grant date | Feb 7, 2017 |
| Priority date | — |
| Expiry date | Jul 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus to measure surface orientation maps of an object may include a light source that is configured to illuminate the object with a controllable field of illumination. One or more cameras may be configured to capture at least one image of the object. A processor may be configured to process the image(s) to extract the reflectance properties of the object including an albedo, a reflection vector, a roughness, and/or anisotropy parameters of a specular reflectance lobe associated with the object. The controllable field of illumination may include limited-order Spherical Harmonics (SH) and Fourier Series (FS) illumination patterns with substantially similar polarization. The SH and FS illumination patterns are used with different light sources.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.