Patent · US Active

Automated defect positioning based on historical data

US9563540B2 · kind B2 · utility

1Cited by

5References

3Claims

0Family size

Assignee

HCL Technologies Limited · IN

Inventors

Dhanyamraju S U M Prasad · Hyderabad, IN
Simy Chacko · Chennai, IN
Satya Sai Prakash K · Hyderabad, IN
Sekhar Ramaraju · Secunderabad, IN
Suresh Naidu P · Hyderabad, IN

Key dates

Filing date	Oct 7, 2014
Grant date	Feb 7, 2017
Priority date	—
Expiry date	Oct 7, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/366
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Disclosed herein are a method and a system for software defect positioning. The system collects at least one type of information with respect to the defect and analyzes the collected input to select a suitable mode of defect positioning procedure. The defect positioning procedures used by the system identify defect location/position based on history data. After identifying the location of the defect, the system communicates the identified defect location/position to a user using a suitable output interface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.