Method and device for image-assisted runway localization
US9569668B2 · kind B2 · utility
7Cited by
3References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 22, 2013 |
| Grant date | Feb 14, 2017 |
| Priority date | — |
| Expiry date | Oct 22, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30256
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and a device for runway localization on the basis of a feature analysis of at least one image of the runway surroundings taken by a landing aircraft is characterized in that, in order to determine the central axis of the runway, feature matching between image features of the image and mirrored image features of the image is carried out, wherein features of the one runway side are made to be congruent with features of the other runway side.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.