Analog to digital converter with high precision offset calibrated integrating comparators
US9571115B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 13, 2015 |
| Grant date | Feb 14, 2017 |
| Priority date | — |
| Expiry date | Nov 13, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/164
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
An analog-to-digital converter includes a plurality of slave sampler multiplexers responsive to outputs of a master sampler that receives analog signals and whose output ports connect to integrating threshold comparators having capacitive digital-to-analog conversion offset adjustments for forming an analog-to-thermometer code conversion. A calibration state machine receives outputs of each of the integrating threshold comparators to control the capacitive digital-to-analog conversion offset adjustment of every integrating threshold comparator and to control a calibration digital-to analog converter. A thermometer code to binary code logic decoder receives outputs of each of the integrating threshold comparators and outputs digital samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.