Method of dynamically changing stitch density for optimal quilter throughput
US9574292B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 2015 |
| Grant date | Feb 21, 2017 |
| Priority date | — |
| Expiry date | Apr 20, 2035 |
Classification
- Technology area (CPC D)Textiles; Paper
- CPC primaryD05C5/00
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
A method of dynamically changing stitch density of a quilting pattern during sewing is provided. Embodiments of the invention include dynamically changing stitch density along an axis of a sewing pattern based on identifying sewing pattern elements, which may include line segments and arc segments. Each of the line segments and/or arc segments is assigned a dynamically adjusted stitch density based on analysis of each pattern element and/or adjacent element. An adjusted stitch density is assigned to portions of pattern elements that satisfy a threshold measurement for sewing with an adjusted stitch density. In embodiments, a standard stitch density, intermediate stitch density, or an altered stitch density is automatically assigned to each portion of a sewing pattern based on an analysis of threshold length of an element, a threshold angle of a portion of the element with respect to the axis, and/or the stitch density assigned to an adjacent element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.