System and method for detection of materials using orbital angular momentum signatures
US9575001B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2015 |
| Grant date | Feb 21, 2017 |
| Priority date | — |
| Expiry date | Nov 16, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/3657
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring a presence of predetermined material within a sample, comprises signal generation circuitry for generating a first signal having an applied first orbital angular momentum signature and applying the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and determines the presence of the predetermined material within the sample based on a detected second orbital angular momentum signature within the first signal received from the sample. The detector provides an output of an indication of the presence of the predetermined material responsive to the determination.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.