Stimulated emission depletion microscopy
US9575302B2 · kind B2 · utility
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19Claims
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Key dates
| Filing date | Aug 16, 2013 |
| Grant date | Feb 21, 2017 |
| Priority date | — |
| Expiry date | Aug 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B26/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aberrations in stimulated emission depletion microscopy are corrected using an adaptive optics approach using a metric which combines both image sharpness and brightness. Light modulators (22,32) are used to perform aberration correction in one or more of the depletion path (10), the excitation path (12), or the emission path from sample to detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.