Vision inspection apparatus and method of compensating gamma defect and mura defect thereof
US9576541B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 7, 2015 |
| Grant date | Feb 21, 2017 |
| Priority date | — |
| Expiry date | Aug 7, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2360/145
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A vision inspection apparatus includes a first luminance profile generator configured to generate a plurality of first luminance profiles corresponding to the plurality of reference grayscales, a gamma corrector configured to calculate a gamma correction value of the display apparatus using the plurality of first luminance profiles corresponding to the plurality of reference grayscales, and a second luminance profile generator configured to apply the gamma correction value to each of the plurality of first luminance profiles and to generate a plurality of second luminance profiles corresponding to the plurality of reference grayscales.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.