Automatic scene calibration
US9578310B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 14, 2013 |
| Grant date | Feb 21, 2017 |
| Priority date | — |
| Expiry date | Jul 28, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30244
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Described herein is a method of calibrating a three-dimensional imaging system. During calibration, a position and an orientation of the three-dimensional imaging system is determined with respect to a first parameter comprising a real world vertical direction (Vw) and to a second parameter comprising an origin of a three-dimensional scene captured by the imaging system. The first and second parameters are used to derive a calibration matrix (MC2w) which is used to convert measurements from a virtual coordinate system (Mc) of the three-dimensional imaging system into a real coordinate system (Mw) related to the real world. The calibration matrix (MC2w) is used to rectify measurements prior to signal processing. An inverse calibration matrix (Mw2c) is also determined. Continuous monitoring and adjustment of the setup of the three-dimensional imaging system is carried out and the calibration matrix (Mc2w) and its inverse (Mw2c) are adjusted accordingly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.