Patent · US Active

Application rating prediction for defect resolution to optimize functionality of a computing device

US9582264B1 · kind B1 · utility

8Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 8, 2015
Grant dateFeb 28, 2017
Priority date
Expiry dateOct 8, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q30/0631
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A computer-implemented method, system, and/or computer program product improves a functionality of a computing device by optimizing improvements to an application running on the computing device. Defects in an application identified by user reviews are prioritized by one or more processors to create a representational model of user reviews. A rating improvement to the application caused by changing the application to resolve complaints represented by top-k negative review representations that are clustered within the predetermined distance from the defect representation is predicted by the processor(s). Based on the predicted rating improvement, the processor(s) apply defect solutions that correct problems described in the top-k negative review representations that are clustered within the predetermined distance from the defect representation to generate an improved version of the application, and then install the improved version of the application on the computing device to improve the functionality of the computing device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.