System and method for measuring the DC-transfer characteristic of an analog-to-digital converter
US9584146B2 · kind B2 · utility
17Cited by
2References
19Claims
0Family size
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Key dates
| Filing date | Oct 19, 2015 |
| Grant date | Feb 28, 2017 |
| Priority date | — |
| Expiry date | Oct 19, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M3/50
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Systems and methods for measuring and compensating a DC-transfer characteristic of analog-to-digital converters are described. A test-signal generator comprising a sigma-delta modulator may provide calibration signals to an ADC. An output from the ADC may be filtered with a notch filter to suppress quantization noise at discrete frequencies introduced by the sigma-delta modulator. The resulting filtered signal may be compared against an input digital signal to the test-signal generator to determine a transfer characteristic of the ADC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.