Patent · US Active

System and method for detection and measurement of interfacial properties in single and multilayer objects

US9588041B2 · kind B2 · utility

2Cited by

27References

31Claims

0Family size

Assignee

PICOMETRIX, LLC · US

Inventors

Jeffrey S. White · Ann Arbor, US
Gregory D. Fichter · Ann Arbor, US
Irl N. Duling, III · Round Hill, US
David Zimdars · Ann Arbor, US

Key dates

Filing date	Oct 13, 2010
Grant date	Mar 7, 2017
Priority date	—
Expiry date	Jul 3, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/3581
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A system for determining a material property at an interface between a first layer and a second layer includes a transmitter outputting electromagnetic radiation to the sample, a receiver receiving electromagnetic radiation that was reflected by or transmitted though the sample, and a data acquisition device. The data acquisition device digitizes the electromagnetic radiation to yield waveform data. The waveform data represents the radiation reflected by or transmitted though the sample. The material property to be determined is generally the adhesive strength between the first and second layers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.