Charged particle tomography with improved momentum estimation
US9588064B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 2015 |
| Grant date | Mar 7, 2017 |
| Priority date | — |
| Expiry date | Oct 2, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods, devices, systems and computer program products produce and utilize improved momentum estimates for charged particles such as electrons and muons. One method for measuring momentum includes obtaining charged particle tomographic data at one or more charged particle position detectors corresponding to scattering angles of charged particles that pass through an object volume. The distribution of scattering angles associated with the charged particles is determined using measured data collected from the position detectors, based on deviations of local trajectories of the charged particles in one or more planes relative to a reference trajectory. The method also includes determining a length of the scattering material based on the characteristics of the position detectors and the charged particles' angle of incidence on the position detectors, and obtaining charged particle momentum estimates based on the determined distribution of scattering angles and the length of the scattering material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.