Method and apparatus for validating a system-on-chip based on a silicon fingerprint and a unique response code
US9590636B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 3, 2014 |
| Grant date | Mar 7, 2017 |
| Priority date | — |
| Expiry date | Apr 3, 2035 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2223/5444
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A system-on-chip including circuit instances, a selector module, a circuit instance module, and a comparing module. The circuit instances have respectively nodes. The circuit instances are designed to provide nominally a same value at each of the nodes. The selector module is configured to generate a selection signal. The circuit instance module is configured to (i) monitor states of the nodes, and (ii) based on the selection signal, select (a) two or more of the states of the nodes, or (b) two or more parameter values generated based on the two or more of the states of the nodes. The comparing module is configured to: compare (i) the two or more of the states of the nodes, or (ii) the two or more parameter values; and based on the comparison, output a bit of (i) a silicon fingerprint of the system-on-chip, or (ii) a unique response code of the system-on-chip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.