Single point offset calibration for inertial sensors
US9594095B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 5, 2013 |
| Grant date | Mar 14, 2017 |
| Priority date | — |
| Expiry date | Aug 17, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C25/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Single Point Offset Correction (SPOC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The SPOC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.