High frequency reference patterns used to determine head-to-media clearance
US9595278B1 · kind B1 · utility
2Cited by
7References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 28, 2015 |
| Grant date | Mar 14, 2017 |
| Priority date | — |
| Expiry date | Oct 28, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/6029
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A test track is written to a recording medium and includes a repeated series of reference patterns. The reference patterns each include a first portion with a high frequency pure tone and a second portion with a higher frequency component. A length of the first portion is greater than a length of the second portion. The series of reference patterns are read to determine first and second harmonic amplitudes, and a head-to-media clearance is determined based on the first and second amplitudes at first and second harmonic frequencies.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.