Time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
US9595432B2 · kind B2 · utility
2Cited by
59References
77Claims
0Family size
Assignee
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Key dates
| Filing date | Dec 7, 2007 |
| Grant date | Mar 14, 2017 |
| Priority date | — |
| Expiry date | Mar 9, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4295
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A time-of-flight mass spectrometer (1) comprises an ion source a segmented linear ion device (10) for receiving sample ions supplied by the ion source and a time-of-flight mass analyzer for analyzing ions ejected from the segmented device. A trapping voltage is applied to the segmented device to trap ions initially into a group of two or more adjacent segments and subsequently to trap them in a region of the segmented device shorter than the group of segments. The trapping voltage may also be effective to provide a uniform trapping field along the length of the device (10).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.