Patent · US Active

Precision measurement of waveforms

US9600445B2 · kind B2 · utility

1Cited by
10References
31Claims
0Family size

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Key dates

Filing dateDec 20, 2013
Grant dateMar 21, 2017
Priority date
Expiry dateJul 16, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/141
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A machine-implemented method for computerized digital signal processing including obtaining a digital signal from data storage or from conversion of an analog signal, and determining, from the digital signal, one or more measuring matrices. Each measuring matrix has a plurality of cells, and each cell has an amplitude corresponding to the signal energy in a frequency bin for a time slice. Cells in each measuring matrix having maximum amplitudes along a time slice and/or frequency bin are identified as maximum cells. Maxima that coincide in time and frequency are identified and a correlated maxima matrix, called a “Precision Measuring Matrix” is constructed showing the coinciding maxima and the adjacent marked maxima are linked into partial chains.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.