Measurement system
US9605998B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 13, 2015 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | Nov 11, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/3534
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement system, comprising: a first light source that generates first light and irradiates an object with the first light, at least one of an intensity, a polarization state, and a wavelength being modulated with a first period in the first light; a second light source that generates second light, at least one of an intensity, a polarization state, and a wavelength being modulated with a second period in the second light; a first optical system that mixes light from the object based on the first light with the second light; a nonlinear optical crystal that generates third light from the mixed light by sum-frequency generation phenomenon, the third light having a frequency equivalent to a sum of a frequency of the light from the object based on the first light and a frequency of the second light; and a photodetector that measures an intensity of the third light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.