Method of evaluating optical characteristics of transparent substrate
US9606020B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2015 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | Sep 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02F1/133502
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is a method of evaluating optical characteristics of a transparent substrate that is disposed on a display device, wherein the optical characteristics of the transparent substrate are evaluated by selecting two values among a quantified resolution index value (T), a quantified reflection image diffusiveness index value (R), and a quantified sparkle index value of the transparent substrate. According to the present invention, a transparent substrate and an anti-glare process that is to be applied to it can be properly selected, depending on purpose and use. The present invention can be utilized, for example, for evaluating optical characteristics of a transparent substrate that is installed in various types of display devices, such as an LCD device, an OLED device, a PDP device, and a tablet type display device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.