Test fixture with thermoelectric cooler and spring-operated holding pin
US9606145B2 · kind B2 · utility
6Cited by
1References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 6, 2014 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | Feb 21, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2877
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture generally includes a thermoelectric cooler (TEC) configured to regulate the temperature of a device under test (DUT). The test fixture may further include a device carrier configured to secure the DUT in a desired position relative to the TEC and a spring-operated pin configured to generate a desired contact pressure between the DUT and the TEC. The desired contact pressure may be selected to achieve a thermal coupling between the DUT and the TEC that maintains the temperature of the DUT at a desired operation level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.