Aging detection circuit and method thereof
US9606172B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 28, 2014 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | May 30, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31725
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An aging detection circuit is provided. The aging detection circuit is configured on a chip and includes a testing circuit and an aging signal generation circuit. The testing circuit is electrically coupled to the aging signal generation circuit. The testing circuit generates an output signal. The aging signal generation circuit includes a signal generation circuit and a selection circuit. The signal generation circuit generates multiple input signals having different frequencies. The selection circuit selectively outputs one of the input signals as an aging signal to an input terminal of the testing circuit or feeds back the output signal generated by the testing circuit to the input terminal of the testing circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.