Systems and methods for detecting memory faults in real-time via SMI tests
US9606889B1 · kind B1 · utility
3Cited by
1References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 4, 2015 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | Sep 18, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/0775
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Defective memory may cause expensive and unnecessary replacements of the memory especially for higher density dynamic random access memory that has ever shrinking topologies. Running memory stress tests in the background for a period of time at set intervals while the operating system is idle may detect and identify memory problems in real-time without requiring a re-boot of the information handling system. The memory defects may be repaired in real-time so as not to cause loss of data by future read or write requests to the identified defective memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.