Context-aware reliability checks
US9607125B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 8, 2015 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | Jul 27, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of an electromigration (EM) check scheme to reduce a pessimism on current density limits by checking wire context. This methodology, in an embodiment, includes applying existing electronic design automation (EDA) flows and tools to identify potentially-failing wires based on a worst-case EM check using conservative foundry current density limits. A more accurate, context-specific check can be performed on the potentially-failing wires to eliminate one or more of the potentially-failing wires if those wires do not experience worst-case conditions and meet current density limits based on an actual context of those wires. A designer can correct remaining wires which are not eliminated by the context-specific check.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.