System and methods of inspecting an object
US9607370B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 15, 2014 |
| Grant date | Mar 28, 2017 |
| Priority date | — |
| Expiry date | Jul 14, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A system for use in inspecting an object is provided. The system includes at least one array of visual imaging devices configured to capture a plurality of two-dimensional images of the object. The array is configured to capture a first set of two-dimensional images over a first predetermined interval and a second set of two-dimensional images over a second predetermined interval that is after the first predetermined interval. The system also includes a computing device coupled to the at least one array of visual imaging devices. The computing device is configured to extract point clouds of the object from the first and second sets of two-dimensional images, generate a three-dimensional model of the object from the extracted point clouds, determine variations in the extracted point clouds from the first and second sets of two-dimensional images, and utilize the determined variations to detect potential anomalies in the three-dimensional model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.