System and method for determining X-ray exposure parameters
US9610057B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2014 |
| Grant date | Apr 4, 2017 |
| Priority date | — |
| Expiry date | May 30, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/408
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
In accordance with one aspect of the present system, a dual energy X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the dual energy X-ray imaging system. The dual energy X-ray imaging system further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The dual energy X-ray imaging system further includes a determination module configured to calculate a first and a second set of main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics of the pre-shot image. The determination module is further configured to send the one or more main-shot parameters to the source controller of the dual energy X-ray imaging system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.