Method for diagnosing optical spectrometers of downhole tools
US9612154B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 19, 2014 |
| Grant date | Apr 4, 2017 |
| Priority date | — |
| Expiry date | Dec 19, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/1213
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing the condition of a spectrometer is provided. In one embodiment, the method includes acquiring optical data from a spectrometer of a downhole tool during flushing of a flowline and selecting a data set from the acquired optical data. The method can also include estimating light scattering and optical drift for the spectrometer based on the selected data set and determining impacts of the estimated light scattering and optical drift for the spectrometer on measurement accuracy of a characteristic of a downhole fluid determinable through analysis of the downhole fluid using the spectrometer. Additional methods, systems, and devices are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.