Methods and apparatus to detect a conductive object
US9612265B1 · kind B1 · utility
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42References
20Claims
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Key dates
| Filing date | Sep 23, 2011 |
| Grant date | Apr 4, 2017 |
| Priority date | — |
| Expiry date | Aug 6, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus scan a first capacitive sensor element that is located in a first scan region for a presence of a conductive object and then scan a second capacitive sensor element that is located in a second scan region for the presence of the conductive object. The scan of the first capacitive sensor element includes applying a ground voltage to a ground element through the second capacitive sensor element, the ground element located in the first scan region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.