Method and device for detecting uniformity of a dark state image of display
US9613553B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 29, 2014 |
| Grant date | Apr 4, 2017 |
| Priority date | — |
| Expiry date | Apr 29, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2340/06
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method and device for detecting uniformity of a dark state image of a display is disclosed. After an acquired dark state image of a display panel is divided into a plurality of areas according to a preset rule, RGB values of each area are determined and converted into XYZ values. The L* and C* values in the CIE-LCH standard are calculated and statistical analysis is performed to the L* and C* values of the areas in the dark state image to determine statistical parameters of the display image. A dark state uniformity coefficient of the dark state image is determined based on the determined statistical parameters, and the uniformity of the dark state image of the display panel is determined through the dark state uniformity coefficient.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.