System and method for determining X-ray exposure parameters

US9615803B2 · kind B2 · utility

Assignee

• General Electric Company · US

Inventors

• Yun Zou · Clifton Park, US
• Rowland Frederick Saunders · Hartland, US
• Scott Stephen Zelakiewicz · Niskayuna, US
• Floribertus P. M. Heukensfeldt Jansen · Ballston Lake, US
• Mark Alan Frontera · Ballston Lake, US
• Uwe Wiedmann · Clifton Park, US
• Vivek Walimbe · Waukesha, US

Key dates

• Filing date: Jun 16, 2014
• Grant date: Apr 11, 2017
• Expiry date: Jun 4, 2035

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B6/544
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-ray detector further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The X-ray detector further includes a determination module configured to calculate one or more main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics. The determination module is further configured to send the one or more main-shot parameters to the source controller of the X-ray imaging system.