Patent · US Active

Method for manufacturing optical interferometer

US9618323B2 · kind B2 · utility

0Cited by
0References
6Claims
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Assignee

Inventors

Key dates

Filing dateJul 31, 2014
Grant dateApr 11, 2017
Priority date
Expiry dateJul 31, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J3/4535
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of manufacturing an optical interferometer includes a first step of forming a first semiconductor portion for a beam splitter and a second semiconductor portion for a movable mirror on a main surface of a support substrate and a first insulating layer formed on the main surface, a second step of disposing a first wall portion between a first side surface of the first semiconductor portion and a second side surface in the second semiconductor portion, and a third step of forming a mirror surface in the second semiconductor portion by forming a first metal film on the second side surface using a shadow mask. In the third step, the first side surface is masked by the mask portion and the first wall portion and the first metal film is formed in a state in which the second side portion is exposed from an opening portion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.