Patent · US Active

Sensor element

US9618406B2 · kind B2 · utility

3Cited by
17References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 1, 2015
Grant dateApr 11, 2017
Priority date
Expiry dateOct 5, 2035

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01L19/04
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A sensor element (1) includes a substrate (2) and a strain-sensitive element (3) which is preferably applied to the substrate by means of thin-film technology and is used for measuring the deformation of the substrate (2) when pressure is applied or a force is introduced, the strain-sensitive element (3) including XAlOyN1-y, wherein X is a metal with a high melting temperature in the range of greater than 1400° C. and 0<y<0.4 applies. A passivation layer (5) can be applied to the strain-sensitive element (3).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.