Patent · US Active

Method and apparatus for testing IC

US9618569B2 · kind B2 · utility

1Cited by

5References

20Claims

0Family size

Assignee

Marvell Israel (M.I.S.L) Ltd. · IL

Inventors

Ofer Benjamin · Netanya, IL
Igal Sade · Haifa, IL
Nasim Nasser · Haifa, IL

Key dates

Filing date	Feb 22, 2012
Grant date	Apr 11, 2017
Priority date	—
Expiry date	Oct 5, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31718
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A testing method includes measuring an electrical parameter of a device under test (DUT) and a corresponding temperature of the DUT one or more times, determining coefficients in a pre-constructed model based on a plurality of measured values of the electrical parameter and corresponding measured temperatures to characterize a relationship of the electrical parameter to the temperature, and determining a quality of the DUT based on the model and a limit value of the electrical parameter at a specified temperature. The model is pre-constructed to characterize the relationship of the electrical parameter to the temperature with the coefficients that are DUT-dependent variables.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.